Artemov, S. V.Radyuk, G. A.Karakhodzhaev, A. A.Abdullaeva, Ya. S.Yakushev, V. P.2019-05-242019-05-242008Artemov, S. V. ... [ve arkadaşları]. (2008). Method of measuring the thickness of the miconductor silicon detectors. The Fifth Eurasian Conference on Nuclear Science and Its Application : Book of abstracts, (s. 37). 14-17 October 2008. Ankara, Turkey.http://kurumsalarsiv.tenmak.gov.tr/handle/20.500.12878/1327enginfo:eu-repo/semantics/openAccessMiconductor silicon detectorsMiconductor silikon dedektörleriMethod of measuring the thicknessKalınlık ölçme yöntemiconferenceObject37