Formation of low-dimensional impurity defective compositions in doped silicon under the thermal and radiation treatments

Makhkamov, Sh.Tursunov, N. A.Karimov, M.Sattiev, A. R.Kurbanov, A. O.Mahmudov, Sh. A.Erdonov, M. N.2019-07-232019-07-232008Makhkamov, Sh. ... [ve arkadaşları]. (2008). Formation of low-dimensional impurity defective compositions in doped silicon under the thermal and radiation treatments. The Fifth Eurasian Conference on Nuclear Science and Its Application : Book of abstracts, (s. 179-180). 14-17 October 2008. Ankara, Turkey.http://kurumsalarsiv.tenmak.gov.tr/handle/20.500.12878/1490enginfo:eu-repo/semantics/openAccessThermal and radiationTermal ve radyasyonDoped siliconKatkılı silikonLow-dimensional impurity defective compositionsDüşük boyutlu kirlilikDefective compositionsKusurlu bileşimlerFormation of low-dimensional impurity defective compositions in doped silicon under the thermal and radiation treatmentsconferenceObject179180