(2004 MAPLD International Conference, 2004) Degalahal, V.; Vijaykrishnan, N; Irwin, M. J.; Çetiner, S.; Alim, Fatih; Unlu, K.; Bölüm Yok
Soft errors are radiation induced ionization events that upset the logic state of the circuit. The sources of these radiations are cosmic in origin; hence traditionally these upsets affected the space and aviation electronics. Due to technology scaling, these upsets are manifesting as errors in general off-the-shelf electronics circuits and hence a good simulation and error estimation tool is needed. In this work we present a new tool called Soft Error Simulation and Estimation Engine (SESEE). In this tool we simulate neutron induced soft error from basic principles, and use this information along with the information from circuit layout and spice-level simulation to calculate the circuit’s soft error rate (SER). Also as a case study the soft error rate of a custom SRAM array is evaluated.