Method of measuring the thickness of the miconductor silicon detectors

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Date
2008
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Publisher
National Academy of Science of Kyrgyzstan, Turkish Atomic Energy Authority
Abstract
Description
Keywords
Miconductor silicon detectors, Miconductor silikon dedektörleri, Method of measuring the thickness, Kalınlık ölçme yöntemi
Citation
Artemov, S. V. ... [ve arkadaşları]. (2008). Method of measuring the thickness of the miconductor silicon detectors. The Fifth Eurasian Conference on Nuclear Science and Its Application : Book of abstracts, (s. 37). 14-17 October 2008. Ankara, Turkey.
URI
http://kurumsalarsiv.tenmak.gov.tr/handle/20.500.12878/1327
Collections
V. Eurasian conference on nuclear science and its application : book of abstracts, 14-17 October 2008. Ankara, Turkey.