Method of measuring the thickness of the miconductor silicon detectors

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dc.contributor.authorArtemov, S. V.
dc.contributor.authorRadyuk, G. A.
dc.contributor.authorKarakhodzhaev, A. A.
dc.contributor.authorAbdullaeva, Ya. S.
dc.contributor.authorYakushev, V. P.
dc.contributor.departmentBölüm Yoktr_TR
dc.date.accessioned2019-05-24T06:55:03Z
dc.date.available2019-05-24T06:55:03Z
dc.date.issued2008
dc.description.sponsorshipTurkish International Cooperation Agency.tr_TR
dc.identifier.citationArtemov, S. V. ... [ve arkadaşları]. (2008). Method of measuring the thickness of the miconductor silicon detectors. The Fifth Eurasian Conference on Nuclear Science and Its Application : Book of abstracts, (s. 37). 14-17 October 2008. Ankara, Turkey.tr_TR
dc.identifier.startpage37tr_TR
dc.identifier.urihttp://kurumsalarsiv.tenmak.gov.tr/handle/20.500.12878/1327
dc.language.isoengtr_TR
dc.publisherNational Academy of Science of Kyrgyzstan, Turkish Atomic Energy Authoritytr_TR
dc.relation.journalThe Fifth Eurasian Conference on Nuclear Science and Its Application : Book of abstracts, 14-17 October 2008. Ankara, Turkey.tr_TR
dc.rightsinfo:eu-repo/semantics/openAccesstr_TR
dc.subjectMiconductor silicon detectorstr_TR
dc.subjectMiconductor silikon dedektörleritr_TR
dc.subjectMethod of measuring the thicknesstr_TR
dc.subjectKalınlık ölçme yöntemitr_TR
dc.titleMethod of measuring the thickness of the miconductor silicon detectorstr_TR
dc.typeconferenceObjecttr_TR
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V. Eurasian conference on nuclear science and its application : book of abstracts, 14-17 October 2008. Ankara, Turkey.