(T.A.E.C., Çekmece Nuclear Research And Training Center, 1974) Birey, H.; TAEK-ÇNAEM
Two different methods based on (a) the tunneling junction model and (b) the optical model are used to determine the metallic aluminum particle concentration in aluminum oxide thin films prepared by thermal evaporation of pure aluminum under appropriate vacuum conditions. The concentration determined from these two models agree with each other at high concentrations and show considerable deviation at low concentrations.